TY  - BOOK
AU  - Bateson,John
TI  - In-circuit testing
SN  - 0442212844
AV  - TK7868.P7B37 1985 
U1  - 621.381/74/0287 19
PY  - 1985///
CY  - New York
PB  - Van Nostrand Reinhold
KW  - Printed circuits
KW  - Testing
N1  - Includes index; Bibliography: p. 219
ER  -