In-circuit testing /

Bateson, John.

In-circuit testing / John Bateson. - New York : Van Nostrand Reinhold, c1985. - xvii, 243 p. : ill. ; 24 cm.

Includes index.

Bibliography: p. 219.

0442212844

84027128


Printed circuits--Testing.

TK7868.P7B37 1985

621.381/74/0287

Riara University Library,
P.O. Box 49940-00100,
Nairobi, Kenya.